Characterization of Microstructured Component Surfaces

Within the scope of the subproject, devices and methods for the characterization of microstructured com-ponent surfaces are being studied. The measurement devices established in the 1st and 2nd funding peri-ods will be supplemented by an open optical coherence tomograph, which allows the measurement of layer thicknesses in addition to surface measurement, and on which fundamental investigations will be carried out. In the field of methods, among other approaches new algorithms for the evaluation of image stacks of the white light interferometer and the optical coherence tomograph are investigated.